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MV-TE6100

MV-TE6100
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  • MV-TE6100
Available downloads:
Model Marvin Test Solutions: MV-TE6100 Dual Channel, 50MHz, 100MS/Sec DSO, Spectrum... more
Product information "MV-TE6100"

Model Marvin Test Solutions: MV-TE6100
Dual Channel, 50MHz, 100MS/Sec DSO, Spectrum Analyzer, DVM and Transient Recorder

  • Four Instruments In One
  • 100 MS/Sec DSO/Spectrum
  • DC to 50 MHz Bandwidth
  • 100mV to 80V Full Scale
  • Powerful Software
  • PXI, 3U single slot

The Marvin Test MV-TE6100 is the first 100 MS/Sec measuring instrument that consists of a Digital Storage Oscilloscope, Spectrum Analyzer, Transient recorder and Voltmeter. This new PXI based, compact measuring instrument, can solve almost every measurement problem. Analyzing signals is done with an 8-bit resolution and a maximum sampling speed of 100 MHz. The input ranges from 0.1 Volt full scale to 80 Volt full scale. The record length is 32K/64K samples.

The MV-TE6100 DSO, Spectrum Analyzer, DVM, and Transient Recorder PXI card has three BNC connector for the two input channels and the digital external trigger. Data throughput is 50MS/s in dual channel mode or 100MS/s on one channel. It is possible to capture up to 32768 pre trigger and post trigger samples to not miss anything of importance of the signal.

Scope of Delivery:

  • Marvin Test Solutions MV-TE6100: Dual Channel, 50MHz, 100MS/Sec DSO, Spectrum Analyzer, DVM and Transient Recorder
  • Manual

Marvin Test Solutions ist ein amerikanischer Hersteller für PXI Instrumente und Software für Funktionstestsysteme und Halbleitertest.

  • Eine besondere Stärke von Marvin Test Solutions sind schnelle digitale Pattern-I/O Karten, FPGA- und SMU Karten im 3U und 6U PXI Formfaktor.
  • Neben Einzelkomponenten liefert Marvin auch vorkonfigurierte Funktionstestsysteme und Halbleitertestsysteme.
  • Mit der ATEasy Entwicklungsumgebung bietet Marvin Kunden, die eine eigene Testsoftware-Architektur realisieren wollen, einen leistungsfähigen Baukasten inkl. integrierter Sequenzerfunktionen.

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