Model Marvin Test Solutions: MV-TE6100
Dual Channel, 50MHz, 100MS/Sec DSO, Spectrum Analyzer, DVM and Transient Recorder
- Four Instruments In One
- 100 MS/Sec DSO/Spectrum
- DC to 50 MHz Bandwidth
- 100mV to 80V Full Scale
- Powerful Software
- PXI, 3U single slot
The Marvin Test MV-TE6100 is the first 100 MS/Sec measuring instrument that consists of a Digital Storage Oscilloscope, Spectrum Analyzer, Transient recorder and Voltmeter. This new PXI based, compact measuring instrument, can solve almost every measurement problem. Analyzing signals is done with an 8-bit resolution and a maximum sampling speed of 100 MHz. The input ranges from 0.1 Volt full scale to 80 Volt full scale. The record length is 32K/64K samples.
The MV-TE6100 DSO, Spectrum Analyzer, DVM, and Transient Recorder PXI card has three BNC connector for the two input channels and the digital external trigger. Data throughput is 50MS/s in dual channel mode or 100MS/s on one channel. It is possible to capture up to 32768 pre trigger and post trigger samples to not miss anything of importance of the signal.
Scope of Delivery:
- Marvin Test Solutions MV-TE6100: Dual Channel, 50MHz, 100MS/Sec DSO, Spectrum Analyzer, DVM and Transient Recorder